学术讲座：Standards and Measurement of LEDs and Solid State Lighting
报告时间：2012年9月17日（星期一）上午10点– 11点
报告地点：玉泉校区教三440
报告地点：玉泉校区教三440
演讲人：Dr Yoshi Ohno, NIST USA
摘要：
Standards for solid state lighting measurement (international and USA) will be first overviewed, including CEN/CIE draft SSL test method, CIE 127 on low power LEDs, IES LM-79 for LED lamps and luminaires, LM-80 and TM-21 for lumen maintenance, LM-82 for light engines, LM-85 (draft) for high power LED packages, and ANSI C78.377 on chromaticity specification.
Standards for solid state lighting measurement (international and USA) will be first overviewed, including CEN/CIE draft SSL test method, CIE 127 on low power LEDs, IES LM-79 for LED lamps and luminaires, LM-80 and TM-21 for lumen maintenance, LM-82 for light engines, LM-85 (draft) for high power LED packages, and ANSI C78.377 on chromaticity specification.
Various measurement methods for LED components to LED luminaires will be presented based on these standards. Measurement methods include measurements of photometric quantities such as total luminous flux, luminous efficacy, luminous intensity distribution, as well as colorimetric quantities such as chromaticity x, y, u¹, v¹, correlated color temperature (CCT), Duv, and color rendering index (CRI). Some guidance on the use of integrating spheres, goniophotometers, and spectroradiometers, including various correction techniques, will also be presented.
演讲人简介：
Yoshi Ohno is actively involved in research pertaining to photometry and colorimetry. Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting.
He is a Fellow of IESNA, currently serves as the Director of CIE Division 2, NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and active in technical committees in CIE, ISO, ANSI, and IESNA.
Ohno received Arthur S. Flemming Award in 2006, CIE de Boer Gold Pin Distinguished Service Award in 2007, and U.S. Department of Commerce Silver Medal Award in 2009.
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