Equipment
Three-dimensional interference microscope (white l
用光的干涉原理,非接触式测量样品的三维形貌,得到三维形貌图以及相关数据。主要是测试三维形貌及非接触式
View DetailsFourier Transform Infrared Spectrometer (FTIR)
Characteristic: Measuring visible, near infrared a
View Details用光的干涉原理,非接触式测量样品的三维形貌,得到三维形貌图以及相关数据。主要是测试三维形貌及非接触式
View DetailsCharacteristic: Measuring visible, near infrared a
View Details