Equipment
near field scanning optical microscope (NSOM)
近场光学显微镜能够以探针作为亚微米光源或探测器以及受抑全反射等三种工作方式探测样品,在没有样品-探针
View Detailsultra high precision mineral material grinding ma
对金属、玻璃、PMMA等各种材料的零件,进行球面、非球面、和自由曲面等形状的纳米级超精密镜面加工
View DetailsField emission scanning electron microscopy (SEM)
特点:具有ESB/SE/INLENS三种探测器,最大可以放大达到42万倍,观察可以是一个样品的表面,
View DetailsThree-dimensional interference microscope (white l
用光的干涉原理,非接触式测量样品的三维形貌,得到三维形貌图以及相关数据。主要是测试三维形貌及非接触式
View DetailsFourier Transform Infrared Spectrometer (FTIR)
Characteristic: Measuring visible, near infrared a
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